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Proceedings Paper

Calibrations Of A Multichannel Soft X-Ray Spectrometer
Author(s): Richard L. Blake; Robert G. Hockaday; John S. Grosso; George C. Idzorek; Burton L. Henke; James L. Wood
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Paper Abstract

A time resolved, 14 channel spectrometer with an absolutely calibrated response, was developed to cover an x-ray photon energy spectrum from 70 to 650 eV. The spectrometer utilized a combination of thin film prefilters, layered synthetic microstructure (LSM) diffractors, metal coated plastic scintillators, and photomultiplier detector tubes. Calibration of the spectrometer was done piecemeal for each component with standard techniques and the component calibrations were convolved to get a complete spectrometer response function. The complete assembled system was also calibrated at a synchrotron beamline. The two calibration procedures were compared.

Paper Details

Date Published: 9 April 1987
PDF: 11 pages
Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); doi: 10.1117/12.964836
Show Author Affiliations
Richard L. Blake, Los Alamos National Laboratory (United States)
Robert G. Hockaday, Los Alamos National Laboratory (United States)
John S. Grosso, Los Alamos National Laboratory (United States)
George C. Idzorek, Los Alamos National Laboratory (United States)
Burton L. Henke, University of California (United States)
James L. Wood, Ovonic Synthetic Materials Co. - ECD (United States)

Published in SPIE Proceedings Vol. 0688:
Multilayer Structures & Laboratory X-Ray Laser Research
Natale M. Ceglio; Pierre Dhez, Editor(s)

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