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Proceedings Paper

Characterization Of Multilayer Structures For Soft X-Ray Laser Research
Author(s): M. Kuhne; K. Danzmann; P. Muller; B. Wende; N. M. Ceglio; D. G. Stearns; A. M. Hawryluk
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Paper Abstract

A reflectometer has been set up at the radiometric laboratory of PTB at the Berlin electron storage ring BESSY. Special attention has been paid to optimize the instrumentation for the characterization of multilayer structures suitable for laboratory soft x-ray laser research. The instrumentation is described and its performance demonstrated showing examples of optical component characterization.

Paper Details

Date Published: 9 April 1987
PDF: 5 pages
Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); doi: 10.1117/12.964825
Show Author Affiliations
M. Kuhne, Institut Berlin (Germany)
K. Danzmann, Institut Berlin (Germany)
P. Muller, Institut Berlin (Germany)
B. Wende, Institut Berlin (Germany)
N. M. Ceglio, University of California (United States)
D. G. Stearns, University of California (United States)
A. M. Hawryluk, University of California (United States)


Published in SPIE Proceedings Vol. 0688:
Multilayer Structures & Laboratory X-Ray Laser Research
Natale M. Ceglio; Pierre Dhez, Editor(s)

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