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Proceedings Paper

Experimental Device for X-UV Gain Measurement Using Interferential Mirror, Fast Time Resolved Detection and On-Line Data Processing
Author(s): A. Carillon; G. Jamelot; A. Klisnick; G. Tevanian; P. Jaegle; P. Dhez
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Paper Abstract
Attempts have been made for using a multilayer interferential mirror in normal incidence to enhance X-UV Amplification of Spontaneous Emission (A.S.E) from an aluminum plasma column in the range of 100 A. Two series of experiments have been performed successively, one dealing with time integrated, the other with time resolved measurements using on line detectors for both series. Detailed description is made of experimental set-ups and a discussion is presented about further improvement.
Paper Details
Date Published: 9 April 1987
PDF: 6 pages
Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); doi: 10.1117/12.964815
Show Author Affiliations
A. Carillon, Universite Paris-Sud (France)
Ecole Polytechnique (France)
G. Jamelot, Universite Paris-Sud (France)
Ecole Polytechnique (France)
A. Klisnick, Universite Paris-Sud (France)
Ecole Polytechnique (France)
G. Tevanian, Universite Paris-Sud (France)
Ecole Polytechnique (France)
P. Jaegle, Universite Paris-Sud (France)
Ecole Polytechnique (France)
P. Dhez, Universite Paris-Sud (France)
Ecole Polytechnique (France)

Published in SPIE Proceedings Vol. 0688:
Multilayer Structures & Laboratory X-Ray Laser Research
Natale M. Ceglio; Pierre Dhez, Editor(s)
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