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Proceedings Paper

High-resolution and high-speed CT in industry and research
Author(s): S. Zabler; C. Fella; A. Dietrich; F. Nachtrab; Michael Salamon; V. Voland; T. Ebensperger; S. Oeckl; R. Hanke; N. Uhlmann
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Paper Abstract

The application of industrial CT covers many orders of magnitude of object sizes, ranging from freight containers (few meters) down to liquid foams (i.e. for food industry) or even parts of insects which are only several hundreds of micrometers in size. Similarly, the specifications for acquisition speed extend over some orders of magnitude, from hours to sub-second CT. We present the current technology in terms of X-ray sources and detectors, along with numerous applications from industry and materials research: e.g. industrial high-speed CT of car pistons, in situ micro-CT of milk foam decay at micrometer spatial resolution and 8 s scan time, as well as ex situ scans of tensile tested Nickel-alloys. The Fraunhofer Development Center X-ray Technology (Fürth, Germany) and the Chair of X-ray Microscopy (University Würzburg, Germany) are currently working on extending the technological limits, demonstrated, e,g. by the development of advanced X-ray detectors or a new inhouse CT system which comprises a high-brilliance liquid metal jet anode.

Paper Details

Date Published: 17 October 2012
PDF: 11 pages
Proc. SPIE 8506, Developments in X-Ray Tomography VIII, 850617 (17 October 2012); doi: 10.1117/12.964588
Show Author Affiliations
S. Zabler, Julius-Maximilians-Univ. Würzburg (Germany)
Fraunhofer-Institut für Integrierte Schaltungen (Germany)
C. Fella, Julius-Maximilians-Univ. Würzburg (Germany)
A. Dietrich, Fraunhofer-Institut für Integrierte Schaltungen (Germany)
F. Nachtrab, Fraunhofer-Institut für Integrierte Schaltungen (Germany)
Michael Salamon, Fraunhofer-Institut für Integrierte Schaltungen (Germany)
V. Voland, Fraunhofer-Institut für Integrierte Schaltungen (Germany)
T. Ebensperger, Julius-Maximilians-Univ. Würzburg (Germany)
Fraunhofer-Institut für Integrierte Schaltungen (Germany)
S. Oeckl, Fraunhofer-Institut für Integrierte Schaltungen (Germany)
R. Hanke, Julius-Maximilians-Univ. Würzburg (Germany)
Fraunhofer-Institut für Integrierte Schaltungen (Germany)
N. Uhlmann, Fraunhofer-Institut für Integrierte Schaltungen (Germany)


Published in SPIE Proceedings Vol. 8506:
Developments in X-Ray Tomography VIII
Stuart R. Stock, Editor(s)

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