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Proceedings Paper

Scanning Aspherical Surfaces With The Focus-Wavelength Encoded Profilometer
Author(s): F. Francini; G. Molesini; F. Quercioli; B. Tiribilli
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Paper Abstract

New developments with the focus-wavelength encoded optical profilometer are reported in the area of applications to surface contouring. Longitudinal chromatic dispersion of a suitably designed lens as a probe is exploited to obtain distance information between the probe and the surface. After proper scanning, the surface topography is recovered.

Paper Details

Date Published: 3 November 1986
PDF: 10 pages
Proc. SPIE 0645, Optical Manufacturing, Testing and Aspheric Optics, (3 November 1986); doi: 10.1117/12.964477
Show Author Affiliations
F. Francini, Istituto Nazionale di Ottica (Italy)
G. Molesini, Istituto Nazionale di Ottica (Italy)
F. Quercioli, Istituto Nazionale di Ottica (Italy)
B. Tiribilli, Istituto Nazionale di Ottica (Italy)


Published in SPIE Proceedings Vol. 0645:
Optical Manufacturing, Testing and Aspheric Optics
Gregory M. Sanger, Editor(s)

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