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Proceedings Paper

Lifetime evaluation of CMOS mixed signal devices
Author(s): A. Linder; J. Furlong; N. Malone; D. Madajian; A. Kar-Roy
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Paper Abstract

New foundry processes continue to produce smaller features and new designs. These new devices must be screened to validate their usefulness for long lifetime use. The Failure-in-Time analysis in conjunction with foundry qualification information can be used to evaluate foundry device lifetimes. This analysis is a helpful tool when zero failure life tests are performed. The reliability of the device is estimated by applying the failure rate to the use conditions. JEDEC publications.2,3,4 are the industry accepted methods.

Paper Details

Date Published: 24 October 2012
PDF: 9 pages
Proc. SPIE 8511, Infrared Remote Sensing and Instrumentation XX, 85110Y (24 October 2012); doi: 10.1117/12.964388
Show Author Affiliations
A. Linder, Raytheon Co. (United States)
J. Furlong, Raytheon Co. (United States)
N. Malone, Raytheon Co. (United States)
D. Madajian, Raytheon Co. (United States)
A. Kar-Roy, TowerJazz (United States)


Published in SPIE Proceedings Vol. 8511:
Infrared Remote Sensing and Instrumentation XX
Marija Strojnik; Gonzalo Paez, Editor(s)

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