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Proceedings Paper

Automatic Pattern Recognition System With Self-Learning Algorithm Based On Feature Template Matching
Author(s): Masato Nakashima; Tetsuo Koezuka; Noriyuki Hiraoka; Takefumi Inagaki
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Paper Abstract

A new self-learning technique has been developed to increase recognition efficiency and improve operability of an automatic pattern recognition system. The new algorithm can automatically make feature templates that emphasize the difference between similar patterns. This algorithm compares all the templates with each other by cross-correlating and picks out similar pattern pairs. The differences between similar patterns are extracted as the feature templates. This system can automatically carry out this procedure for 100 template patterns in 5 minutes.

Paper Details

Date Published: 26 March 1986
PDF: 7 pages
Proc. SPIE 0635, Applications of Artificial Intelligence III, (26 March 1986); doi: 10.1117/12.964164
Show Author Affiliations
Masato Nakashima, Fujitsu Laboratories Ltd. (Japan)
Tetsuo Koezuka, Fujitsu Laboratories Ltd. (Japan)
Noriyuki Hiraoka, Fujitsu Laboratories Ltd. (Japan)
Takefumi Inagaki, Fujitsu Laboratories Ltd. (Japan)

Published in SPIE Proceedings Vol. 0635:
Applications of Artificial Intelligence III
John F. Gilmore, Editor(s)

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