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Proceedings Paper

A Flight Expert System (FLES) For On-Board Fault Monitoring And Diagnosis
Author(s): M. Ali; D. .A Scharnhorst; C. S. Ai; H. J. Ferber
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Paper Abstract

The increasing complexity of modern aircraft creates a need for a larger number of caution and warning devices. But more alerts require more memorization and higher work loads for the pilot and tend to induce a higher probability of errors. Therefore, we have developed an architecture for a flight expert system (FLES) to assist pilots in monitoring, diagnosing and recovering from in-flight faults. A prototype of FLES has been implemented. A sensor simulation model was developed and employed to provide FLES with the airplane status information during the diagnostic process. The simulator is based partly on the Lockheed Advanced Concept System (ACS), a future generation airplane, and partly on the Boeing 737, an existing airplane. A distinction between two types of faults, maladjustments and malfunctions, has led us to take two approaches to fault diagnosis. These approaches are evident in two FLES subsystems: the flight phase monitor and the sensor interrupt handler. The specific problem addressed in these subsystems has been that of integrating information received from multiple sensors with domain knowledge in order to assess abnormal situations during airplane flight. This paper describes our reasons for handling malfunctions and maladjustments separately and the use of domain knowledge in the diagnosis of each.

Paper Details

Date Published: 26 March 1986
PDF: 4 pages
Proc. SPIE 0635, Applications of Artificial Intelligence III, (26 March 1986); doi: 10.1117/12.964111
Show Author Affiliations
M. Ali, The University of Tennessee Space Institute (United States)
D. .A Scharnhorst, The University of Tennessee Space Institute (United States)
C. S. Ai, The University of Tennessee Space Institute (United States)
H. J. Ferber, The University of Tennessee Space Institute (United States)

Published in SPIE Proceedings Vol. 0635:
Applications of Artificial Intelligence III
John F. Gilmore, Editor(s)

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