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Proceedings Paper

Critical Current Density Measurements In High Tc "Insitu" YBa2Cu3O7-8 Superconducting Thin Films
Author(s): C. B. Lee; R. K. Singh; P. Tiwari; J. Narayan
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Paper Abstract

Critical current density measurements have been made on in-situ processed and patterned, laser deposited thin films.These films were deposited on LaA103 and KTa03 with substrate temperatures ranging at from 500-650°C. Epitaxial growth was achieved as targets of Y (123) and Y (123) Ag3 were ablated by an excimer laser in an oxygen ambient atmosphere. A steel mask was placed near the substrate to pattern the films. Transport critical current density was measured as a function of temperature in order to ascertain any role flux pinning may play in determining critical current density.

Paper Details

Date Published: 23 February 1990
PDF: 9 pages
Proc. SPIE 1190, Laser/Optical Processing of Electronic Materials, (23 February 1990); doi: 10.1117/12.963979
Show Author Affiliations
C. B. Lee, North Carolina State University (United States)
R. K. Singh, North Carolina State University (United States)
P. Tiwari, North Carolina State University (United States)
J. Narayan, North Carolina State University (United States)


Published in SPIE Proceedings Vol. 1190:
Laser/Optical Processing of Electronic Materials
Jagdish Narayan, Editor(s)

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