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Proceedings Paper

Phase Retardation Measurement For Simple Kinoform Technology
Author(s): Maciej Sypek
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Paper Abstract

The paper presents a new technique of quantitative performing of kinoforms. During preparing the kinoform a photochemical operations have been used. The phase retardation in each zone is controlled by a new diffraction technique. A standard photographic plate glass substrate is sufficient for described method.

Paper Details

Date Published: 12 April 1990
PDF: 7 pages
Proc. SPIE 1183, Holography '89, (12 April 1990); doi: 10.1117/12.963886
Show Author Affiliations
Maciej Sypek, Warsaw Institute of Technology (Poland)


Published in SPIE Proceedings Vol. 1183:
Holography '89

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