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Proceedings Paper

Quantitative Voltage Measurement By A Software Closed Loop Technique In Electron Beam Testing
Author(s): Yasuo Furukawa; Yoshiro Goto; Toshihiro Ishizuka; Kazuo Ookubo; Takefumi Inagaki
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Paper Abstract

A software closed loop technique was devised for quantitative voltage measurement in electron beam testing for LSIs. A retarding voltage of an energy analyzer is controlled iteratively by a computer to reduce difference between a slice level and a secondary electron signal to zero. The voltage is determined by the retarding voltage at the cross point of the slice level and the energy distribution curve. Using this technique, the waveform of 256 sampling phases with more than 5 V amplitude can be measured in about 30 s with 200 mV voltage resolution and 100 ps time resolution.

Paper Details

Date Published: 30 June 1986
PDF: 5 pages
Proc. SPIE 0632, Electron-Beam, X-Ray, and Ion-Beam Technology for Submicrometer Lithographies V, (30 June 1986); doi: 10.1117/12.963689
Show Author Affiliations
Yasuo Furukawa, Fujitsu Laboratories Ltd. (Japan)
Yoshiro Goto, Fujitsu Laboratories Ltd. (Japan)
Toshihiro Ishizuka, Fujitsu Laboratories Ltd. (Japan)
Kazuo Ookubo, Fujitsu Laboratories Ltd. (Japan)
Takefumi Inagaki, Fujitsu Laboratories Ltd. (Japan)


Published in SPIE Proceedings Vol. 0632:
Electron-Beam, X-Ray, and Ion-Beam Technology for Submicrometer Lithographies V
Phillip D. Blais, Editor(s)

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