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Proceedings Paper

Laser Diode Characterization Instrumentation
Author(s): J. T. Orosz; J. L. Tode; E. G. Vaerewyck
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Paper Abstract

The requirements for laser diode characterization are continually increasing in sophistication and accuracy. Simple optical power versus drive current curves are not adequate to characterize laser diodes for the variety of present and future applications from telecommunications to data gathering and optical processing. Presently available integrated test sets provide opto-electronic, spectral, far-field, and near-field characterization of laser diodes in the visible and near-infrared regions. Measurements on connectorized and optical fiber pigtailed devices are readily performed. Equipment for evaluation of astigmatism, coherence length, optical noise intensity and polarization ratios will be available in the near future. Important goals in the development of all laser diode characterization equipment are precision, reliability, traceability to NIST (NBS), versatility for graceful upgrading to encompass emerging device requirements and fully-integrated, user friendly software to assure high throughput from a smooth gathering and flow of data from logically sequenced tests.

Paper Details

Date Published: 23 January 1990
PDF: 9 pages
Proc. SPIE 1180, Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (23 January 1990); doi: 10.1117/12.963468
Show Author Affiliations
J. T. Orosz, ILX Lightwave Corporation (United States)
J. L. Tode, ILX Lightwave Corporation (United States)
E. G. Vaerewyck, ILX Lightwave Corporation (United States)


Published in SPIE Proceedings Vol. 1180:
Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
Shekhar G. Wadekar, Editor(s)

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