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Proceedings Paper

Backscatter Signature Generator For OTDR Calibration
Author(s): Chun Keung Hui; Neil Kamikawa; Ken Yamada
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Paper Abstract

This paper describes an active characterization technique that generates backscatter signatures to measure the performance of optical time-domain reflectometers (OTDRs). These signatures can be used to test an OTDR's loss accuracy, dynamic range, spatial resolution, loss resolution, and receiver recovery time.

Paper Details

Date Published: 23 January 1990
PDF: 8 pages
Proc. SPIE 1180, Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (23 January 1990); doi: 10.1117/12.963454
Show Author Affiliations
Chun Keung Hui, Naval Ocean Systems Center -- Hawaii Laboratory (United States)
Neil Kamikawa, Naval Ocean Systems Center -- Hawaii Laboratory (United States)
Ken Yamada, Naval Ocean Systems Center -- Hawaii Laboratory (United States)


Published in SPIE Proceedings Vol. 1180:
Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
Shekhar G. Wadekar, Editor(s)

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