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Proceedings Paper

Radiation Damage Of Titanium Diffused Lithium Niobate Devices
Author(s): C. A. Jack; A. S. Kanofsky
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Paper Abstract

The damage due to ionizing radiation on titanium diffused lithium niobate waveguide devices is investigated. Several waveguide devices containing straights, bends, and directional couplers are irradiated with both gamma radiation and high energy electrons. Passive optical measurements as well as in-situ measurements are performed on the exposed waveguide devices. It was found that the waveguide devices were hard to gamma radiation at doses up to 3.8 x 106 rads. Also the waveguide devices showed small permanent changes to high doses (3300 Mrads) of electron radiation.

Paper Details

Date Published: 5 January 1990
PDF: 6 pages
Proc. SPIE 1177, Integrated Optics and Optoelectronics, (5 January 1990); doi: 10.1117/12.963343
Show Author Affiliations
C. A. Jack, AT&T Bell Laboratories (United States)
A. S. Kanofsky, Lehigh University (United States)

Published in SPIE Proceedings Vol. 1177:
Integrated Optics and Optoelectronics
Leon McCaughan; Mark A. Mentzer; Song-Tsuen Peng; Henry J. Wojtunik; Ka Kha Wong, Editor(s)

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