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Proceedings Paper

Analysis Of Spatial Pseudodepolarizers In Imaging Systems
Author(s): James P. McGuire; Russell A. Chipman
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Paper Abstract

The objective of a number of optical instruments is to measure the intensity accurately without bias to incident polarization state. One method to overcome polarization bias in optical systems is the insertion of a spatial pseudodepolarizer. Both the degree of pseudodepolarization and image degradation (from the polarization aberrations of the pseudodepolarizer) are analyzed for two depolarizer designs: the Cornu pseudodepolarizer effective for linearly polarized light and the dual Babinet compensator pseudodepolarizer effective for all incident polarization states. The image analysis uses the matrix formalism presented in a previous paper ("Diffraction image formation and analysis in optical systems with polarization aberrations I: Formulation and example") to describe the polarization dependence of the the diffraction patterns and optical transfer function.

Paper Details

Date Published: 25 January 1990
PDF: 14 pages
Proc. SPIE 1166, Polarization Considerations for Optical Systems II, (25 January 1990); doi: 10.1117/12.962882
Show Author Affiliations
James P. McGuire, University of Alabama in Huntsville (United States)
Russell A. Chipman, University of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 1166:
Polarization Considerations for Optical Systems II
Russell A. Chipman, Editor(s)

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