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Proceedings Paper

Measurements Of Polarization Scattering In The Vacuum Ultraviolet
Author(s): Kenneth A. Herren
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Paper Abstract

NASA's In-Situ Contamination Effects Facility, Marshall Space Flight Center will be used to measure the polarization scattering from optical surfaces due to outgassed molecular contamination. Measurements will be taken using a non-coherent vacuum ultraviolet (VUV) source at 123.6 nm and a set of three solar blind VUV photomultipliers. An in-plane VUV BRDF experiment is described and details of the on-going program to characterize optical materials exposed to the space environment is reported.

Paper Details

Date Published: 25 January 1990
PDF: 9 pages
Proc. SPIE 1166, Polarization Considerations for Optical Systems II, (25 January 1990); doi: 10.1117/12.962876
Show Author Affiliations
Kenneth A. Herren, The University of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 1166:
Polarization Considerations for Optical Systems II
Russell A. Chipman, Editor(s)

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