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Proceedings Paper

Linearity In BSDF Measurements
Author(s): Fredrick M. Cady; Donald R. Bjork; Jeffrey Rifkin; John C. Stover
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Paper Abstract

A method to generate a transfer function accounting for instrument measurement non-linearities is given. The BSDF instrument itself is used to make two measurement scans. One of these scans is taken at normal incident power and the second with a neutral density filter in the optics chain. Using the information generated by these scans, and assuming that the system is linear over some range of its operation, a transfer function may be generated to characterize the system and to allow non-linearities to be compensated for.

Paper Details

Date Published: 2 January 1990
PDF: 12 pages
Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962849
Show Author Affiliations
Fredrick M. Cady, TMA Technologies, Inc. (United States)
Donald R. Bjork, TMA Technologies, Inc. (United States)
Jeffrey Rifkin, TMA Technologies, Inc. (United States)
John C. Stover, TMA Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 1165:
Scatter from Optical Components
John C. Stover, Editor(s)

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