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Proceedings Paper

BRDF Error Analysis
Author(s): Fredrick M. Cady; Donald R. Bjork; Jeffrey Rifkin; John C. Stover
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Paper Abstract

A Bidirectional reflectance distribution function (BRDF) error analysis is given. Errors in measuring each of the components of BRDF are analyzed and a total RMS error calculation is given. A computerized error analysis allows each of the terms to be tested for their effect on the total error. This shows that different error mechanisms contribute in different measurement regimes.

Paper Details

Date Published: 2 January 1990
PDF: 11 pages
Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962845
Show Author Affiliations
Fredrick M. Cady, TMA Technologies Inc. (United States)
Donald R. Bjork, TMA Technologies Inc. (United States)
Jeffrey Rifkin, TMA Technologies Inc. (United States)
John C. Stover, TMA Technologies Inc. (United States)

Published in SPIE Proceedings Vol. 1165:
Scatter from Optical Components
John C. Stover, Editor(s)

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