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Proceedings Paper

The Prediction Of BRDFs From Surface Profile Measurements
Author(s): E. L. Church; P. Z. Takacs; T. A. Leonard
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Paper Abstract

This paper discusses methods of predicting the BRDF of smooth surfaces from profile measurements of their surface finish. The conversion of optical profile data to the BRDF at the same wavelength is essentially independent of scattering models, while the conversion of mechanical measurements, and wavelength scaling in general, are model dependent. Procedures are illustrated for several surfaces, including two from the recent HeNe BRDF round robin, and results are compared with measured data. Reasonable agreement is found except for surfaces which involve significant scattering from isolated surface defects which are poorly sampled in the profile data.

Paper Details

Date Published: 2 January 1990
PDF: 15 pages
Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962842
Show Author Affiliations
E. L. Church, USA ARDEC (United States)
P. Z. Takacs, Brookhaven National Laboratory (United States)
T. A. Leonard, Ball Systems Engineering (United States)

Published in SPIE Proceedings Vol. 1165:
Scatter from Optical Components
John C. Stover, Editor(s)

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