Share Email Print

Proceedings Paper

An ERIM Perspective On BRDF Measurement Technology
Author(s): C. Blake Arnold; Jerry L. Beard
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Bidirectional Reflection Distribution Function (BRDF) facilities at ERIM have been employed since the late 1960s to characterize the spatial, polarization, and spectral content of the scatter from target/background materials. This paper explores the "lessons learned" over the years, concentrating on the characterization of calibration standards, the expected variation of BRDF of materials, and the utility of BRDF data in the prediction of material/complex object radiative transfer. Expected and unusual material characteristics as a function of wavelength and polarization will be reviewed, as well as the procedures that have been used to provide accurate and repeatable BRDF data. The laboratory equipment that has been used will be briefly discussed, emphasizing the necessary characteristics and functions of the hardware needed to gather valid BRDF data. Finally, the utility/assessment/requirement of BRDF data to support modeling activities will be presented from the "ERIM" image/sensor information exploitation standpoint.

Paper Details

Date Published: 2 January 1990
PDF: 24 pages
Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962841
Show Author Affiliations
C. Blake Arnold, Environmental Research Institute of Michigan (ERIM) (United States)
Jerry L. Beard, Environmental Research Institute of Michigan (ERIM) (United States)

Published in SPIE Proceedings Vol. 1165:
Scatter from Optical Components
John C. Stover, Editor(s)

© SPIE. Terms of Use
Back to Top