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Proceedings Paper

Surface Statistics Determined From IR Scatter
Author(s): Tod F. Schiff; John C. Stover
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Paper Abstract

This paper examines the requirement for reflector "smoothness" that is imposed when BRDF data is used to calculate surface statistics. There are applications for use of these calculations at surfaces that appear rough at visible wavelengths (greater than about 300 angstroms). Wavelength extension into the mid IR and increasing the angle of incidence are the two techniques investigated. Experimental results are compared to two widely used diffraction calculations by using known sinusoidal gratings and the advantages and limitations of each are discussed. Extension of the calculations to surfaces that have surface features as large as 5000 angstroms has been demonstrated at a wavelength of 10.6 micrometers.

Paper Details

Date Published: 2 January 1990
PDF: 10 pages
Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962836
Show Author Affiliations
Tod F. Schiff, TMA Technologies, Inc. (United States)
John C. Stover, TMA Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1165:
Scatter from Optical Components
John C. Stover, Editor(s)

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