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Proceedings Paper

Surface Topography Measurements Over The 1 Meter To 10 Micrometer Spatial Period Bandwidth
Author(s): Peter Z. Takacs; Karen Furenlid; Robert A. DeBiasse; Eugene L. Church
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Paper Abstract

A recently-developed long-trace surface profiling instrument (LTP) is now in operation in our laboratory measuring surface profiles on grazing incidence aspheres and also conventional optical surfaces. The LTP characterizes surface height profiles in a non-contact manner over spatial periods ranging from 1 meter (the maximum scan length) to 2 mm (the Nyquist period for 1 mm sampling period) and complements the range of our WYKO NCP-1000 2.5X surface roughness profiler (5 mm to 9.8 pm). Using these two instruments, we can fully characterize both figure and finish of an optical surface in the same way that we normally characterize surface finish, e.g., by means of the power spectral density function in the spatial frequency domain. A great deal of information about the distribution of figure errors over various spatial frequency ranges is available from this data, which is useful for process control and predicting performance at the desired wavelength and incidence angle. In addition, the LTP is able to measure the absolute radius of curvature on long-radius optics with high precision and accuracy. Angular errors in the optical head are measured in real time by an electronic autocollimator as the head traverses the linear air bearing slide. Measurements of kilometer radius optics can be made very quickly and the data analyzed in a format that is very easy to understand.

Paper Details

Date Published: 20 December 1989
PDF: 9 pages
Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); doi: 10.1117/12.962824
Show Author Affiliations
Peter Z. Takacs, Brookhaven National Laboratory (United States)
Karen Furenlid, Brookhaven National Laboratory (United States)
Robert A. DeBiasse, Brookhaven National Laboratory (United States)
Eugene L. Church, USA ARDEC (United States)


Published in SPIE Proceedings Vol. 1164:
Surface Characterization and Testing II
John E. Greivenkamp; Matthew Young, Editor(s)

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