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Proceedings Paper

Radial Metrology With A Panoramic Annular Lens
Author(s): Donald R. Matthys; Pal Greguss; John A. Gilbert; David L. Lehner; Amy S. Kransteuber
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Paper Abstract

In the present paper, cavity shapes are profiled using two opposing collinear panoramic annular lenses. A speckle pattern is projected out from one panoramic annular lens onto a reference stan d or onto lle cavity wall itself, and the resulting speckle distribution is recorded through e second panoramic annular lens. Since the speckle pattern moves as the shape of the cavity changes, H e variation in cavity shape can be measured by applying correlation techniques to the speckle patterns obtained before and after the cavity shape is modified. The apparent speckle movement is computed by numerically correlating small subsets extracted from each pattern. These shifts are used to measure surface deflections or to contour the cavity with respect to a reference shape.

Paper Details

Date Published: 20 December 1989
PDF: 10 pages
Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); doi: 10.1117/12.962820
Show Author Affiliations
Donald R. Matthys, Marquette University (United States)
Pal Greguss, Technical Univ. of Budapest (Hungary)
John A. Gilbert, University of Alabama in Huntsville (United States)
David L. Lehner, University of Alabama in Huntsville (United States)
Amy S. Kransteuber, University of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 1164:
Surface Characterization and Testing II
John E. Greivenkamp; Matthew Young, Editor(s)

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