Share Email Print

Proceedings Paper

High Resolution Optical Profiler
Author(s): Katherine Creath
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An interferometric optical profiler using a Videk Megaplus camera interfaced to an 80386-based computer has been developed for measuring surface roughness and three-dimensional profiles with high spatial resolution. The camera has 1320 x 1035 square pixels which are 6.8 gm on a side. Fields of view over 1024 x 1024 pixels can range from 35 gm to 4642 gm with spatial sampling intervals of 0.034 pm to 4.5 gm. The spatial resolution is limited by the optical resolution of the system. The computer system consists of a 80386 microprocessor and a floating point coprocessor, an AT compatible IQ bus, and a VGA monitor with software running under Xenix 386. Digital data from the camera is captured using a frame grabber and displayed as live video on a monitor at 7 frames per second. The rms repeatability of measurements made with this instrument is better than 0.7 nm and can be half this value with averaging. This paper describes the system and its performance along with results of measuring various samples such as gratings, diamond turned optics, magnetic media, recording heads, and plastics.

Paper Details

Date Published: 20 December 1989
PDF: 6 pages
Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); doi: 10.1117/12.962817
Show Author Affiliations
Katherine Creath, WYKO Corporation (United States)

Published in SPIE Proceedings Vol. 1164:
Surface Characterization and Testing II
John E. Greivenkamp; Matthew Young, Editor(s)

© SPIE. Terms of Use
Back to Top