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Proceedings Paper

Surface Profile Measurements Of Curved Parts
Author(s): T. C. Bristow; G. Wagner; J. R. Bietry; R. A. Auriemma
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Paper Abstract

This paper describes the implementation of an automatic focus control system (Autofocus) to an optical non-contact surface profiling instrument. Such a focus control system extends the operation of the surface profiler to measurements of both roughness and figure that would otherwise be limited by the optical systems depth of focus. Measurement results are presented from a variety of curved samples.

Paper Details

Date Published: 20 December 1989
PDF: 8 pages
Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); doi: 10.1117/12.962816
Show Author Affiliations
T. C. Bristow, Chapman Instruments (United States)
G. Wagner, Chapman Instruments (United States)
J. R. Bietry, Chapman Instruments (United States)
R. A. Auriemma, Chapman Instruments (United States)


Published in SPIE Proceedings Vol. 1164:
Surface Characterization and Testing II
John E. Greivenkamp; Matthew Young, Editor(s)

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