Share Email Print

Proceedings Paper

Carrier-Based Automatic Phase-Shift Method
Author(s): H. M. Shi; J. Fang; F. L. Dai; G. C. Jin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new phase-shift method based on the spatial phase modulated carrier fringe pattern is presented in this paper. The four phase-shifted fringe patterns, in which the phase differences between the adjacent pattern are n12, can be generated from only one fringe pattern, and all of the procedures can be done automatically. This method can be used in the condition of incoherent metrology and dynamic measurement.

Paper Details

Date Published: 20 December 1989
PDF: 7 pages
Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); doi: 10.1117/12.962803
Show Author Affiliations
H. M. Shi, Tsinghua University (China)
J. Fang, Tsinghua University (China)
F. L. Dai, Tsinghua University (China)
G. C. Jin, Tsinghua University (China)

Published in SPIE Proceedings Vol. 1164:
Surface Characterization and Testing II
John E. Greivenkamp; Matthew Young, Editor(s)

© SPIE. Terms of Use
Back to Top