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Proceedings Paper

Accuracy Of Fringe Pattern Analysis
Author(s): Gui-Ying Wang; Xiao-Ping Ling
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Paper Abstract

In this paper, affecting factors on accuracy of fitting wavefron of light beam with orthogonal polynomials are given theoretically in terms of F-test method of statistics. The method availability to control accuracy has also been verified experimentally by an axial hologram reconstruction.

Paper Details

Date Published: 20 November 1989
PDF: 7 pages
Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); doi: 10.1117/12.962800
Show Author Affiliations
Gui-Ying Wang, Academia Sinica (China)
Xiao-Ping Ling, Academia Sinica (China)

Published in SPIE Proceedings Vol. 1163:
Fringe Pattern Analysis
Graeme T. Reid, Editor(s)

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