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Proceedings Paper

Automated Laser-Diode Interferometry With Phase-Shift Stabilization
Author(s): Yukihiro Ishii
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Paper Abstract

A Twyman-Green phase-shifting interferometer with a laser diode (LD) source was constructed for testing an optical element. An automated interferometric system was developed in which the laser current is continuously changed to synchronize intensity data acquisition with vertical drive pulses of a charge-coupled device (CCD). The intensity of interference pattern is integrated with a CCD detector for intervals of one-quarter period of one fringe. A microcomputer calculates the phase to be measured. To avoid the mode instability of LD, a feedback interferometer with extra TTL electronics is made to stabilize the phase shift using the frequency tuning of LD. The experimental result is shown to measure the profile of a diamond-turned Al surfa-ce.

Paper Details

Date Published: 20 November 1989
PDF: 5 pages
Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); doi: 10.1117/12.962793
Show Author Affiliations
Yukihiro Ishii, University of Industrial Technology (Japan)


Published in SPIE Proceedings Vol. 1163:
Fringe Pattern Analysis
Graeme T. Reid, Editor(s)

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