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Proceedings Paper

Multiwaveband Phase Interferometer
Author(s): B. R. Hill
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Paper Abstract

The objectives and reasoning behind the specification of a new test instrument are analysed with brief reference to the instrument it was to replace. The theory, development and operation of a 150 mm diameter scanning multi-waveband phase interferometer is described. This entails a description of how the method of phase modulation evolved with reference to its linearity and ability to operate over a very wide range of wavelengths (.6 um - 10.6 um). The method of phase measurement and its resistance to vibration is described with a brief outline of the electronic building blocks required for the operation and calibration of the instrument. The requirements and choice of computer are discussed. It will then be shown how the above elements can be put together to form a very compact and versatile instrument. The functions of the associated software are also described both for data capture and display, which is real time, and also for analysis of the captured data. The analysis includes MTF, PSF, LSF, encircled energy, polynomial fitting, homogeneity measurement and the manipulation of stored interferograms. Results from the final instrument will also be presented.

Paper Details

Date Published: 20 November 1989
PDF: 11 pages
Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); doi: 10.1117/12.962791
Show Author Affiliations
B. R. Hill, Pilkington Technology Centre (England)

Published in SPIE Proceedings Vol. 1163:
Fringe Pattern Analysis
Graeme T. Reid, Editor(s)

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