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Proceedings Paper

CCD Based Moire Interferometric Strain Sensor (MISS)
Author(s): A. Asundi; Kan Man Fung
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Paper Abstract

The Moire Interferometric Strain Sensor (MISS) is based on the principle that gratings diffract light in preferred directions determined by their frequency. Hence by tracking the change in diffraction angle the frequency of the grating can be determined. In engineering applications, a grating attached to the specimen would change frequency as a consequence of the strain at that point. Thus the change in diffraction angle can directly be related to strain. Since for most elastic strain measurements the change in diffraction angle is very small, this paper describes the use of a CCD array to improve the sensitivity.

Paper Details

Date Published: 20 November 1989
PDF: 8 pages
Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); doi: 10.1117/12.962787
Show Author Affiliations
A. Asundi, University of Hong Kong (Hong Kong)
Kan Man Fung, University of Hone Kong (Hong Kong)


Published in SPIE Proceedings Vol. 1163:
Fringe Pattern Analysis
Graeme T. Reid, Editor(s)

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