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Proceedings Paper

Field Shift Moire, A New Technique For Absolute Range Measurement
Author(s): Albert Boehnlein; Kevin Harding
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Paper Abstract

A new and novel technique is discussed that provides non-contact high resolution absolute measurements with moire interferometry. Field shift moire provides both a course absolute measurement and a high resolution relative measurement similar to a vernier caliper. Combining these measurements yields absolute high-resolution range information.

Paper Details

Date Published: 20 November 1989
PDF: 12 pages
Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); doi: 10.1117/12.962775
Show Author Affiliations
Albert Boehnlein, Industrial Technology Institute (United States)
Kevin Harding, Industrial Technology Institute (United States)

Published in SPIE Proceedings Vol. 1163:
Fringe Pattern Analysis
Graeme T. Reid, Editor(s)

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