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Proceedings Paper

In Situ Application Of Electronic Speckle Pattern Interferometry (ESPI) In The Investigation Of Stone Decay
Author(s): G. Gulker; K. Hinsch; C. Holscher; A. Kramer; H. Neunaber
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Paper Abstract

A miniaturized electronic speckle pattern interferometry system (ESPI) has been developed for in situ measurements of microdeformations on buildings and monuments. Direct coupling between object and the compact optical head of the system enabled detection of microdisplacements even in non laboratory environments. Several examples of applications in deterioration investigations are presented.

Paper Details

Date Published: 25 April 1990
PDF: 12 pages
Proc. SPIE 1162, Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series, (25 April 1990); doi: 10.1117/12.962743
Show Author Affiliations
G. Gulker, Carl-von-Ossietzky Universitat Oldenburg (Germany)
K. Hinsch, Carl-von-Ossietzky Universitat Oldenburg (Germany)
C. Holscher, Carl-von-Ossietzky Universitat Oldenburg (Germany)
A. Kramer, Carl-von-Ossietzky Universitat Oldenburg (Germany)
H. Neunaber, Carl-von-Ossietzky Universitat Oldenburg (Germany)


Published in SPIE Proceedings Vol. 1162:
Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series
Ryszard J. Pryputniewicz, Editor(s)

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