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Proceedings Paper

Very Large Area 2048 And 4096 CCD Image Sensors
Author(s): Richard A. Bredthauer
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Paper Abstract

The design and performance of two very high resolution CCD imagers will be described. Both devices utilize a 7.5 micron pixel and are fabricated with three-level polysilicon to achieve high yield. Dynamic range, charge transfer efficiency, spectral response and successful imagery are demonstrated.

Paper Details

Date Published: 22 December 1989
PDF: 6 pages
Proc. SPIE 1161, New Methods in Microscopy and Low Light Imaging, (22 December 1989); doi: 10.1117/12.962689
Show Author Affiliations
Richard A. Bredthauer, Ford Aerospace Corporation (United States)


Published in SPIE Proceedings Vol. 1161:
New Methods in Microscopy and Low Light Imaging
John E. Wampler, Editor(s)

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