Share Email Print

Proceedings Paper

The Extreme Ultraviolet Explorer: Overview And Calibration
Author(s): Barry Y. Welsh; John V. Vallerga; Pat Jelinsky; Peter W. Vedder; Stuart Bowyer; Roger F. Malina
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Extreme Ultraviolet Explorer (EUVE) is a NASA funded astronomy mission which will operate in the 70 -760 Å band. The science payload, which has been designed and built by the Space Sciences Laboratory at the University of California, Berkeley, consists of three grazing incidence scanning telescopes and an EUV spectrometer/deep survey instrument. We give details of the planned mission profile together with an overview of the instrumentation which comprises the science payload. Topics such as the thermal design, contamination control and details of the electronics system are discussed. Finally we review the results of the calibration of the various sub-systems that make up the EUVE instrumentation and discuss the calibration plan for the integrated EUVE instruments which began in June 1989 at the Berkeley EUV Calibration Facility.

Paper Details

Date Published: 28 July 1989
PDF: 10 pages
Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962679
Show Author Affiliations
Barry Y. Welsh, University of California (United States)
John V. Vallerga, University of California (United States)
Pat Jelinsky, University of California (United States)
Peter W. Vedder, University of California (United States)
Stuart Bowyer, University of California (United States)
Roger F. Malina, University of California (United States)

Published in SPIE Proceedings Vol. 1160:
X-Ray/EUV Optics for Astronomy and Microscopy
Richard B. Hoover, Editor(s)

© SPIE. Terms of Use
Back to Top