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Proceedings Paper

X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.
Author(s): A. Hornstrup; F. E. Christensen; H. W. Schnopper
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Paper Abstract

We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.

Paper Details

Date Published: 28 July 1989
PDF: 11 pages
Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962675
Show Author Affiliations
A. Hornstrup, Danish Space Research Institute (Denmark)
F. E. Christensen, Danish Space Research Institute (Denmark)
H. W. Schnopper, Danish Space Research Institute (Denmark)


Published in SPIE Proceedings Vol. 1160:
X-Ray/EUV Optics for Astronomy and Microscopy
Richard B. Hoover, Editor(s)

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