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Proceedings Paper

Optical Performance Vs. Prediction Analysis For The Sxt Mirror Assembly At X-Ray Wavelengths
Author(s): C. G. Hull-Allen; D. C. Jordan; J. J. Kumler; A. F. Slomba; R. G. Kusha; P. Glenn; J. Lemen; R. Catura
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Paper Abstract

Accurate prediction of focal plane performance is difficult at x-ray wavelengths for grazing incidence optical systems with very highly obscured apertures like the SXT mirror assembly. For such instruments, geometrical models give way to diffraction based descriptions of performance. Because diffraction heavily influences the imagery of an x-ray system, the traditional image quality parameters of geometrical optics are not always appropriate quality critera. The definition and utility of the traditional image quality parameters have been a subject of recent discussion, along with the methodology of converting measurables into the parameters required by diffraction based theory. This paper describes a modeling approach that was used to set telescope surface specifications in order to achieve a desired encircled energy and spot size at an operating wavelength of 13.3Å. Assumptions that were made before fabrication will be presented first. Next, performance predicted by replacing many of these assumptions with actual parameters obtained from measurement of the as-built surfaces (for example the power spectrum of the mid and high spatial frequency figure errors) was compared to test data taken in the NASA/Marshall x-ray testing facility. Finally, an estimate was made of the rms spot size, from knife edge data. This is discussed in terms of its usefulness as a descriptor of telescope performance.

Paper Details

Date Published: 28 July 1989
PDF: 17 pages
Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962666
Show Author Affiliations
C. G. Hull-Allen, United Technologies Optical Systems (United States)
D. C. Jordan, United Technologies Optical Systems (United States)
J. J. Kumler, United Technologies Optical Systems (United States)
A. F. Slomba, United Technologies Optical Systems (United States)
R. G. Kusha, United Technologies Optical Systems (United States)
P. Glenn, Bauer Associates (United States)
J. Lemen, LMSC/PARL (United States)
R. Catura, LMSC/PARL (United States)

Published in SPIE Proceedings Vol. 1160:
X-Ray/EUV Optics for Astronomy and Microscopy
Richard B. Hoover, Editor(s)

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