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Proceedings Paper

Multilayer X-Ray Optics Produced By Atomic Layer Epitaxy
Author(s): K. Shurtleff; D. Allred; R. Perkins; J. Thorne
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Paper Details

Date Published: 28 July 1989
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Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962655
Show Author Affiliations
K. Shurtleff, Brigham Young University (United States)
D. Allred, Brigham Young University (United States)
R. Perkins, Brigham Young University (United States)
J. Thorne, Brigham Young University (United States)


Published in SPIE Proceedings Vol. 1160:
X-Ray/EUV Optics for Astronomy and Microscopy
Richard B. Hoover, Editor(s)

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