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Proceedings Paper

Development Of A Normal Incidence Multilayer, Imaging X-Ray Microscope
Author(s): David L. Shealy; Richard B. Hoover; Arthur B.C. Walker; Troy W. Barbee
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Paper Abstract

Normal incidence multilayer x-ray mirror technology has now advanced to the point that high resolution x-ray microscopes with relatively large fields of view are feasible. High resolution aplanatic imaging x-ray microscopes configured from low x-ray scatter normal incidence multilayer optics should be ideal for laser fusion research, biological investigations, and for astronomical studies when used in conjunction with grazing incidence or multilayer x-ray telescope systems. We have designed several Schwarzschild x-ray microscope optics. Diffraction analysis indicates better than 400 A spatial res-olution in the object plane up to a 1 mm field of view can be achieved with 125 A radiation . We are currently fabricating a 20x normal incidence multilayer x-ray microscope of 1.35 meter overall length. We have also analyzed and designed other microscope systems for use in conjunction with x-ray telescopes. We report on the results of these studies and the x-ray microscope fabrication effort.

Paper Details

Date Published: 28 July 1989
PDF: 13 pages
Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962633
Show Author Affiliations
David L. Shealy, University of Alabama at Birmingham (United States)
Richard B. Hoover, NASA Marshall Space Flight Center (United States)
Arthur B.C. Walker, Stanford University (United States)
Troy W. Barbee, Lawrence Livermore National Laboratory (United States)

Published in SPIE Proceedings Vol. 1160:
X-Ray/EUV Optics for Astronomy and Microscopy
Richard B. Hoover, Editor(s)

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