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Proceedings Paper

Advances In Multilayer X-Ray/EUV Optics: Synthesis, Performance And Instrumentation
Author(s): Troy W. Barbee
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Paper Abstract

The field of multilayer optics for the X-ray, Soft X-ray and extreme ultra violet is maturing at a rapid pace. There are more than fourty groups worldwide actively working in this area. A large part of these efforts are directed to improving the quality of multilayer structures by developing a better understanding of the synthesis-structure-property relationships. Although the quality of multilayer structures may be substantially improved there are now significant instruemental apllications for these reflecting optics. In this paper the current status of this field is discussed.

Paper Details

Date Published: 27 November 1989
PDF: 17 pages
Proc. SPIE 1159, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics, (27 November 1989); doi: 10.1117/12.962618
Show Author Affiliations
Troy W. Barbee, Lawrence Livermore National Laboratory (United States)

Published in SPIE Proceedings Vol. 1159:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics
Charles J. Hailey; Oswald H. W. Siegmund, Editor(s)

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