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Proceedings Paper

High Resolution X-Ray Spectroscopy Using Germanium Microcalorimeters
Author(s): E. Silver; S. Labov; F. Goulding; N. Madden; D. Landis; J. Beeman; T. Pfafman; L. Melkonian; I. Millett; Y. Wai
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Paper Abstract

We are developing cryogenically-cooled microcalorimeters for high resolution x-ray spectroscopy. Using neutron transmutation-doped (NTD) germanium thermistors as the x-ray absorber, we have achieved an energy resolution of 70 eV at a temperature of 0.3 K. There is strong evidence for incomplete conversion of x-ray energy into thermal energy when the photon is absorbed in the bulk of the NTD germanium. We believe that the nonthermal energy component manifests as ionization, none of which is converted to thermal energy within the measurement time of the system. As in an ionization detector, the division between ionization and thermal energy is statistically uncertain and leads to a lower limit to the energy resolution measured using either the thermal or ionization signal. Complete conversion to thermal energy with no loss to ionization appears to occur when the x-ray is absorbed by the metallic contacts. This will be discussed in the context of our most recent 0.3 K experiments.

Paper Details

Date Published: 27 November 1989
PDF: 10 pages
Proc. SPIE 1159, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics, (27 November 1989); doi: 10.1117/12.962600
Show Author Affiliations
E. Silver, Lawrence Livermore National Laboratory (United States)
S. Labov, Lawrence Livermore National Laboratory (United States)
F. Goulding, Lawrence Berkeley National Laboratory (United States)
N. Madden, Lawrence Berkeley National Laboratory (United States)
D. Landis, Lawrence Berkeley National Laboratory (United States)
J. Beeman, Lawrence Berkeley National Laboratory (United States)
T. Pfafman, University of California, Berkeley (United States)
L. Melkonian, University of California, Berkeley (United States)
I. Millett, University of California, Berkeley (United States)
Y. Wai, University of California, Berkeley (United States)


Published in SPIE Proceedings Vol. 1159:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics
Charles J. Hailey; Oswald H. W. Siegmund, Editor(s)

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