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Proceedings Paper

Flat Field Response Of The Microchannel Plate Detectors Used On The Extreme Ultraviolet Explorer
Author(s): J. V. Vallerga; J. L. Gibson; O. H. W. Siegmund; P. W. Vedder
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Paper Abstract

We present the results of the extreme ultraviolet (EUV) flat field calibrations of two of the flight detectors to be flown on the Extreme Ultraviolet Explorer Satellite (EUVE). Images of ~40 million detected events binned 512 by 512 are sufficient to show MCP fixed pattern noise such as hexagonal microchannel multifiber bundle interfaces, "dead" spots, edge distortion, and differential nonlinearity. Differences due to photocathode material and dependencies on EUV wavelength are also described. Over large spatial scales the detector response is flat to better than 10% of the mean response but at spatial scales less than 1 mm the variations from the mean can be as large as 20%.

Paper Details

Date Published: 27 November 1989
PDF: 10 pages
Proc. SPIE 1159, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics, (27 November 1989); doi: 10.1117/12.962596
Show Author Affiliations
J. V. Vallerga, University of California (United States)
J. L. Gibson, University of California (United States)
O. H. W. Siegmund, University of California (United States)
P. W. Vedder, University of California (United States)


Published in SPIE Proceedings Vol. 1159:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics
Charles J. Hailey; Oswald H. W. Siegmund, Editor(s)

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