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Proceedings Paper

X-Ray Characteristics Of CCD's for the XMM Reflection Grating Spectrometer (RGS)
Author(s): Fred A. Jansen; Marc Heppener; Henry J.M. Aarts; Piet A.J. de Korte
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Paper Abstract

The Reflection Grating Spectrometer (RGS) experiment on the X-ray Multi-Mirror (XMM) spacecraft will consist of two identical medium resolution ( ~100 - 560) reflection grating spectrometers operating in the 5-35 Å range.1 The dispersed X-ray beam will be detected by an array of 10 CCD's (nine for spectroscopy, one for wavelength and alignment calibration). This paper describes the requirements set upon CCD performance by this experiment as well as the first results obtained with a special test setup which has been designed as to allow optimum flexibility in changing all CCD parameters (clock sequences, slopes, bias voltages etc.) under software control.

Paper Details

Date Published: 27 November 1989
PDF: 8 pages
Proc. SPIE 1159, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics, (27 November 1989); doi: 10.1117/12.962570
Show Author Affiliations
Fred A. Jansen, Lab. for Space Research Leiden (The Netherlands)
Marc Heppener, Lab. for Space Research Leiden (The Netherlands)
Henry J.M. Aarts, Lab. for Space Research Leiden (The Netherlands)
Piet A.J. de Korte, Lab. for Space Research Utrecht (The Netherlands)


Published in SPIE Proceedings Vol. 1159:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics
Charles J. Hailey; Oswald H. W. Siegmund, Editor(s)

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