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Proceedings Paper

MAMA Detector Systems: A Status Report
Author(s): J. Gethyn Timothy; Jeffrey S. Morgan; David C. Slater; David B. Kasle; Richard L. Bybee; H. Ed Culver
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Paper Abstract

A number of different MAMA detector systems are now in use at both ultraviolet and visible wavelengths. MAMA detectors with formats of 256 x 1024 pixels and with pixel dimensions of 25 x 25 microns2 are being used in the laboratory and at ground-based telescopes and an ultraviolet version has recently been flown on a Black Brant sounding rocket. Third-generation (224 x 960)-pixel MAMA detectors with 25 x 25 microns2 pixels are also being used in the laboratory and at ground-based telescopes and a (224 x 960)-pixel detector with 14 x 14 microns2 pixels is currently under test in the laboratory. Third-generation MAMA detectors with formats of 360 x 1024 pixels are under development for use at extreme ultraviolet (EUV) wavelengths on the European Space Agency/NASA Solar and Heliospheric Observatory (SOHO) mission and detectors with 1024 x 1024 and 2048 x 2048 pixels are under development for use at ultraviolet and far ultraviolet (FUV) wavelengths on the NASA Goddard Space Flight Center's Hubble Space Telescope Imaging Spectrograph (STIS). Both of these detectors have pixel dimensions of 25 x 25 microns2. This paper describes the configurations, modes-of-operation and some of the latest performance data for the different detector systems.

Paper Details

Date Published: 28 December 1989
PDF: 14 pages
Proc. SPIE 1158, Ultraviolet Technology III, (28 December 1989); doi: 10.1117/12.962535
Show Author Affiliations
J. Gethyn Timothy, Stanford University (United States)
Jeffrey S. Morgan, Stanford University (United States)
David C. Slater, Stanford University (United States)
David B. Kasle, NASA Goddard Space Flight Center (United States)
Richard L. Bybee, Ball Aerospace Systems Group (United States)
H. Ed Culver, Ball Aerospace Systems Group (United States)


Published in SPIE Proceedings Vol. 1158:
Ultraviolet Technology III
Robert E. Huffman, Editor(s)

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