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Proceedings Paper

Non-Contact Picosecond Electro-Optic Sampling Utilizing Semiconductor Laser Pulses
Author(s): S. Aoshima; H. Takahashi; T. Nakamura; Y. Tsuchiya
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Paper Abstract

Non-contact picosecond electro-optic sampling utilizing semiconductor laser pulses, which is compact, easy to use and inexpensive, is described focusing on the recent improvements such as reduction of system noise, adoption of a longitudinal E-0 probe and its advantages, monitoring system of the measurement point, and improvement of the space dependent sensitivity. We demonstrate the equivalent input noise of 125mV/IHz with a temporal resolution of 45ps at a distance of 20gm between the probe tip and the device under test, with a 4.5s measuring time. We also discuss the possibility of absolute voltage measurement.

Paper Details

Date Published: 17 January 1990
PDF: 12 pages
Proc. SPIE 1155, Ultrahigh Speed and High Speed Photography, Photonics, and Videography '89: Seventh in a Series, (17 January 1990); doi: 10.1117/12.962455
Show Author Affiliations
S. Aoshima, Hamamatsu Photonics K.K. (Japan)
H. Takahashi, Hamamatsu Photonics K.K. (Japan)
T. Nakamura, Hamamatsu Photonics K.K. (Japan)
Y. Tsuchiya, Hamamatsu Photonics K.K. (Japan)


Published in SPIE Proceedings Vol. 1155:
Ultrahigh Speed and High Speed Photography, Photonics, and Videography '89: Seventh in a Series
Gary L. Stradling, Editor(s)

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