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Proceedings Paper

Z-Scan: A Simple And Sensitive Technique For Nonlinear Refraction Measurements
Author(s): M. Sheik-bahae; A. A. Said; T. H. Wei; Y. Y. Wu; D. J. Hagan; M. J. Soileau; E. W. Van Stryland
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Paper Abstract

We describe a sensitive technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond frequency doubled Nd:YAG laser pulses.

Paper Details

Date Published: 4 January 1990
PDF: 11 pages
Proc. SPIE 1148, Nonlinear Optical Properties of Materials, (4 January 1990); doi: 10.1117/12.962142
Show Author Affiliations
M. Sheik-bahae, University of Central Florida (United States)
A. A. Said, University of Central Florida (United States)
T. H. Wei, University of Central Florida (United States)
Y. Y. Wu, University of Central Florida (United States)
D. J. Hagan, University of Central Florida (United States)
M. J. Soileau, University of Central Florida (United States)
E. W. Van Stryland, University of Central Florida (United States)


Published in SPIE Proceedings Vol. 1148:
Nonlinear Optical Properties of Materials
Howard R. Schlossberg; Raymond V. Wick, Editor(s)

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