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Proceedings Paper

Refractive Index Profiles Of Ti:LiNbO3 Planar, Stripe And Buried Waveguides
Author(s): J. Steffen; A. Neyer; E. Voges
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Paper Abstract

The reflectivity measurement of angular polished surfaces of Ti:LiNbO3 waveguides is utilized to determine directly the refractive index profiles of planar and stripe waveguides with an accuracy of dn/n = 10-4 and a local resolution of < 0.1 μm in depth and < 1 μm in width.

Paper Details

Date Published: 6 December 1989
PDF: 5 pages
Proc. SPIE 1141, 5th European Conf on Integrated Optics: ECIO '89, (6 December 1989); doi: 10.1117/12.961911
Show Author Affiliations
J. Steffen, Universitat Dortmund (Germany)
A. Neyer, Universitat Dortmund (Germany)
E. Voges, Universitat Dortmund (Germany)


Published in SPIE Proceedings Vol. 1141:
5th European Conf on Integrated Optics: ECIO '89

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