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Proceedings Paper

Soft X-Ray Microscopy In Laser-Plasmas
Author(s): K. A. Tanaka; M Kado; R. Kodama; M. Ohtani; S. Kitamoto; T. Yamanaka; K. Yamashita; S. Nakai
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Paper Abstract

X-ray microscopy is of extreme importance for measurement of plasma behavior in inertially confinement fusion. We have built a Schwarzschild type x-ray microscope for an x-ray wavelength of λ = 70Å. Nickel Carbon (Ni/C) multilayers have been tested for the normal incidence coating. Reported are critical points of the coating and characteristics of the microscope such as overall reflectivity and spatial resolution.

Paper Details

Date Published: 27 November 1989
PDF: 6 pages
Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); doi: 10.1117/12.961868
Show Author Affiliations
K. A. Tanaka, Osaka University (Japan)
M Kado, Osaka University (Japan)
R. Kodama, Osaka University (Japan)
M. Ohtani, Osaka University (Japan)
S. Kitamoto, Osaka University (Japan)
T. Yamanaka, Osaka University (Japan)
K. Yamashita, Osaka University (Japan)
S. Nakai, Osaka University (Japan)


Published in SPIE Proceedings Vol. 1140:
X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation
Rene Benattar, Editor(s)

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