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Proceedings Paper

Diffuse Scattering By Rough Surfaces At Soft-X-Ray Characteristic Wavelengths
Author(s): R. Barchewitz; J. M. Andre
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Paper Abstract

The influence of the surface-roughness induced scattering and the subsequent decrease of the specular reflectance is a major problem in designing X-UV optical systems such as grazing incidence mirrors used in imaging telescopes and synchrotron beam lines, or multi-layer structures recently developed as selective reflectors in the X-UV region. In this study, absolute reflectivity measurements are performed at soft-X-ray characte-ristic wavelengths and the effects of surface roughness are evidenced. The angular distri-bution of the reflected/scattered radiation (ADSR) is obtained by keeping the mirror fixed while scanning the detector. The ADSR presents a specular component and a diffuse scattering component (DSC). The DSC reveals characteristic features : side peaks and asymmetry, which can be analysed within the framework of the first-order vector theory of the roughness induced scattering.

Paper Details

Date Published: 27 November 1989
PDF: 5 pages
Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); doi: 10.1117/12.961857
Show Author Affiliations
R. Barchewitz, Universite Paris (France)
J. M. Andre, Universite Paris (France)


Published in SPIE Proceedings Vol. 1140:
X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation

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