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Proceedings Paper

A Versatile Curved-Crystal Spectrometer
Author(s): C. Senemaud; D. Laporte; J. M. Andre; R. Kherouf; P. Paquier; M. Ringuenet
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Paper Abstract

A high resolution, curved-crystal spectrometer of compact design is described. It can be adapted to any X-ray source and covers the 0.5 to 10 nm wavelength range. The scanning of spectra is obtained by means of a novel mechanical arrangement using two coaxial rotary stages and a system of rotating arms. (patent nr 86.08871). The step-by-step scanning of spectra is driven by an Apple Ile microcomputer which is also used to perform the data acquisition for X-ray emission, X-ray absorption and isochromat spectra.

Paper Details

Date Published: 27 November 1989
PDF: 5 pages
Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); doi: 10.1117/12.961856
Show Author Affiliations
C. Senemaud, Laboratoire de Chimie Physique (France)
D. Laporte, Laboratoire de Chimie Physique (France)
J. M. Andre, Laboratoire de Chimie Physique (France)
R. Kherouf, Laboratoire de Chimie Physique (France)
P. Paquier, Laboratoire de Chimie Physique (France)
M. Ringuenet, Laboratoire de Chimie Physique (France)


Published in SPIE Proceedings Vol. 1140:
X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation
Rene Benattar, Editor(s)

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