Share Email Print
cover

Proceedings Paper

Characterization Of X-Ray Optics By Synchrotrcn Radiation
Author(s): M. Kuhne; P. Muller
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A reflectometer has been set up at the radiometric laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY. The reflectometer is used in connection with a toroidal grating monochromator and operates primarily in the wavelength range from 5 nm to 40 nm. The instrumentation is described and examples are given for the characterization of multilayer mirrors and transmission gratings.

Paper Details

Date Published: 27 November 1989
PDF: 6 pages
Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); doi: 10.1117/12.961827
Show Author Affiliations
M. Kuhne, Institut Berlin (Germany)
P. Muller, Institut Berlin (Germany)


Published in SPIE Proceedings Vol. 1140:
X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation

© SPIE. Terms of Use
Back to Top